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dc.contributor.author박성주-
dc.date.accessioned2020-10-26T05:48:10Z-
dc.date.available2020-10-26T05:48:10Z-
dc.date.issued2003-02-
dc.identifier.citationProceedings of the 41st Design Automation Conference, Page.510-513en_US
dc.identifier.urihttps://dl.acm.org/doi/10.1145/996566.996707-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/154906-
dc.description.abstractIn order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feedback cycles are reduced with minimal switching activity on the state variables. Experiment shows significant improvement in power dissipation and testabilities for benchmark circuits.en_US
dc.language.isoen_USen_US
dc.publisher대한전자공학회en_US
dc.subjectState Encodingen_US
dc.subjectFault Coverageen_US
dc.subjectLow poweren_US
dc.subjectScan designen_US
dc.titleA New State Assignment Technique for Testing and Low Poweren_US
dc.typeArticleen_US
dc.contributor.googleauthorPark, Sungju-
dc.contributor.googleauthorCho, Sangwook-
dc.contributor.googleauthorYang, Seiyang-
dc.contributor.googleauthorCiesielski, Maciej-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF COMPUTING[E]-
dc.sector.departmentDIVISION OF COMPUTER SCIENCE-
dc.identifier.pidpaksj-
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COLLEGE OF COMPUTING[E](소프트웨어융합대학) > COMPUTER SCIENCE(소프트웨어학부) > Articles
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