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Anisotropic dielectric properties in epitaxial Bi3.25La0.75Ti3O12 thin films along different crystal directions

Title
Anisotropic dielectric properties in epitaxial Bi3.25La0.75Ti3O12 thin films along different crystal directions
Author
강보수
Keywords
FERROELECTRIC PROPERTIES; ELECTRICAL-PROPERTIES; BI4-XLAXTI3O12; ORIENTATION; DEPENDENCE; ELECTRODES; DEPOSITION; BI4TI3O12
Issue Date
2004-09
Publisher
AMER INST PHYSICS
Citation
Applied Physics Letters. v. 85, No. 13, Page. 2586-2588
Abstract
Epitaxial (001)-oriented Bi3.25La0.75Ti3O12 (BLT) thin films were grown by pulsed-laser deposition on (001) LaAlO3 single-crystal substrates. The dielectric properties of the BLT films are highly anisotropic along different crystal directions. The dielectric constants are 358 and 160 along [100] and [1(1) over bar 0], respectively. Dielectric nonlinearity is also detected along these crystal directions. On the other hand, a much smaller dielectric constant and no detectable dielectric nonlinearity in a field range of 0-200 kV/cm are observed for a film along [001] where c-axis oriented SrRuO3 is used as the bottom electrode. (C) American Institute of Physics.
URI
https://information.hanyang.ac.kr/#/eds/detail?an=edselc.2-52.0-7544247826&dbId=edselchttps://repository.hanyang.ac.kr/handle/20.500.11754/151737
ISSN
0003-6951
DOI
10.1063/1.1797536
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > APPLIED PHYSICS(응용물리학과) > Articles
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