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dc.contributor.author박성주-
dc.date.accessioned2020-07-06T06:02:01Z-
dc.date.available2020-07-06T06:02:01Z-
dc.date.issued2004-08-
dc.identifier.citation전자공학회논문지 - SD, v.41, No. 8, Page. 621-628en_US
dc.identifier.issn1229-6368-
dc.identifier.urihttps://information.hanyang.ac.kr/#/eds/detail?an=edskci.ARTI.870079&dbId=edskci-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/151667-
dc.description.abstract여러 개의 IP 코아로 구성원 SoC(System-on-a-Chip)를 위해, 테스트 래퍼와 스캔 체인의 다양한 연결구성이 가능한 테스트 기술이 제안되고 있다. 본 논문에서는, 테스트 래퍼와 스캔 체인을 효과적으로 재구성하며 테스트 할 수 있는 새로운 SoC 테스트 접근 기법을 소개한다. IEEE 1149 1 및 P1500 기반의 테스트 래퍼를 위해 테스트 래퍼 제어기인 WCLM(Wrapped Core Linking Module)과, WCLM과 맞물려 코아 내부의 스캔 체인에 효과적으로 접근 가능한 TAM(Test Access Mechnism) 구조를 제안한다. For a System-on-a-Chip(SoC) comprised of multiple IP cores, test control techniques have been developed to perform the internal and external test efficiently relying on the various design for testability techniques such as scan and BIST(Built-In Self-Test) However the test area overhead is too expensive to guarantee diverse test link configurations In tins paper, at first we introduce a new flag based Wrapped Core Linking Module(WCLM) that enables systematic integration of IEEE 1149.1 TAP'd cores and Pl500 wrapped cores Then a simple test control technique, which can interconnect internal scan chains of different cores, is described with requiring least amount of area overhead compared with other state-af-art techniques The design preserves compatibility With standards and scalability for hierarchical accessen_US
dc.language.isoko_KRen_US
dc.publisher대한전자공학회en_US
dc.subjecttestingen_US
dc.subjectscanen_US
dc.subjectTAPen_US
dc.subjectWCLMen_US
dc.subjectCASen_US
dc.title재구성 가능한 시스템 칩 테스트 제어기술의 개발en_US
dc.title.alternativeDevelopment of Simple Reconfigurable Access Mechanism for SoC Testingen_US
dc.typeArticleen_US
dc.relation.journal전자공학회논문지-
dc.contributor.googleauthor김태식-
dc.contributor.googleauthor민병우-
dc.contributor.googleauthor박성주-
dc.relation.code2012210989-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF COMPUTING[E]-
dc.sector.departmentDIVISION OF COMPUTER SCIENCE-
dc.identifier.pidpaksj-
Appears in Collections:
COLLEGE OF COMPUTING(소프트웨어융합대학)[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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