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dc.contributor.author배석주-
dc.date.accessioned2020-03-26T01:27:50Z-
dc.date.available2020-03-26T01:27:50Z-
dc.date.issued2019-03-
dc.identifier.citationINTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE, v. 26, NO 1, Page. 71-82en_US
dc.identifier.issn1072-4761-
dc.identifier.issn1943-670X-
dc.identifier.urihttps://access.hanyang.ac.kr/link.n2s?url=http://search.ebscohost.com/login.aspx?direct=true&db=a9h&AN=135984084&lang=ko&site=eds-live-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/139474-
dc.description.abstractAccelerated life tests (ALTs) have been used to assess reliability of one-shot devices in a short time. Due to destructive characteristics of one-shot devices, lifetime data of the devices is incomplete and enough number of failures or even no failures may be not secured in ALT. In such situations, Baysian methods incorporating prior information into the parameters provide useful inference on the reliability of one-shot devices. In this paper, we propose a modeling approach to predict functional reliability of pin pullers as a kind of one-shot devices, mainly in a Bayesian framework. We introduce three different priors to the parameters of the Weibull distribution or reliability function. Sress-strength relationships of key components in pin pullers are employed to the scale and shape parameters via three prior densities. The proposed methods are illustrated with a variety of simulation studies. The simulation works are performed using the Gibbs sampling technique to generate MCMC samples to obtain Bayesian estimates of the Weibull parameters. The Bayesian estimates from the three priors tend to approach to true parameter values as sample size increases.en_US
dc.description.sponsorshipThis work was supported by Leading Core Technology Program sponsored by Defense Acquisition Program Administration and Agency for Defense Development under the project title "High-Performance PMD Technology for Guided Missiles" (No. UE145095GD), and Human Resources Program in Energy Technology of the Korea Institute of Energy Technology Evaluation and Planning (KETEP), granted financial resource from the Ministry of Trade, Industry & Energy, Republic of Korea (No. 20174030201750).en_US
dc.language.isoenen_US
dc.publisherUNIV CINCINNATI INDUSTRIAL ENGINEERINGen_US
dc.subjectBayesian approachen_US
dc.subjectfunctional reliabilityen_US
dc.subjectone-shot deviceen_US
dc.subjectpin pulleren_US
dc.subjectWeibull distributionen_US
dc.titleA BAYESIAN APPROACH FOR PREDICTING FUNCTIONAL RELIABILITY OF ONE-SHOT DEVICESen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume26-
dc.relation.page71-82-
dc.relation.journalINTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICE-
dc.contributor.googleauthorMun, Byeong Min-
dc.contributor.googleauthorLee, Chinuk-
dc.contributor.googleauthorJang, Seung-gyo-
dc.contributor.googleauthorRyu, Byung Tae-
dc.contributor.googleauthorBae, Suk Joo-
dc.relation.code2019041855-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF INDUSTRIAL ENGINEERING-
dc.identifier.pidsjbae-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > INDUSTRIAL ENGINEERING(산업공학과) > Articles
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