A Vehicle SoC Test Technique using FlexRay Protocol

Abstract

This paper provides a fault diagnosis technology of SoC in vehicle using FlexRay protocol to detect the fault of the semiconductor control chip constituting the body electronic system even after production of the vehicle. This includes a method that can distinguish normal mode and test mode operation by transferring frame which load specific identification in payload segment and by using Null Frame Indicator (NFI) bit of FlexRay frame before FlexRay protocol works. This causes a problem that fault detecting rate becomes decrease, if tests are performed to detect faults in broken chips because of aging and other various reasons. So it is possible to supplement these weakness and possible to prevent unsuspected accident that caused by degradation of vehicle network system using proposed technology. Also there is an advantage that can guarantee safety of vehicles by performing Structural test for SoC in vehicles.