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dc.contributor.author김동규-
dc.date.accessioned2019-12-08T20:02:18Z-
dc.date.available2019-12-08T20:02:18Z-
dc.date.issued2018-08-
dc.identifier.citationCOMPUTERS & ELECTRICAL ENGINEERING, v. 70, page. 74-82en_US
dc.identifier.issn0045-7906-
dc.identifier.issn1879-0755-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0045790617329956?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/119813-
dc.description.abstractThis study presents an optical secure circuit for physical attack protection. On-chip photodiodes are integrated for optical energy harvesting to operate the optical secure circuit in a standard CMOS process. The aim of the proposed optical secure circuit is to protect the secure contents of the IC against external unpowered attacks. When invasive unpowered physical attacks such as decapsulation are attempted, the photodiodes accumulate charge from ambient light and activate the secure circuit path that shuts down the secure data path. The proposed secure circuit is fabricated using a standard 0.18 mu m 1P6M CMOS process with a small active area of 0.34 mm(2) with fully integrated on-chip photodiodes. When the chip is decapsulated and unpowered, the supply voltage of 600 mV with the ambient light is generated by the optical harvester, and the security data paths are shut down in 500 ns.en_US
dc.description.sponsorshipThis work was supported by Samsung Research Funding Center of Samsung Electronics under Project Number SRFC-IT1601-01. This research was also supported by IC Design Education Center (IDEC).en_US
dc.language.isoen_USen_US
dc.publisherPERGAMON-ELSEVIER SCIENCE LTDen_US
dc.subjectOptical energy harvestingen_US
dc.subjectOptical secure circuiten_US
dc.subjectOn-chip photodiodeen_US
dc.subjectHardware securityen_US
dc.subjectPhysical attack protectionen_US
dc.titleSecure circuit with optical energy harvesting against unpowered physical attacksen_US
dc.typeArticleen_US
dc.relation.volume70-
dc.identifier.doi10.1016/j.compeleceng.2018.06.005-
dc.relation.page74-82-
dc.relation.journalCOMPUTERS & ELECTRICAL ENGINEERING-
dc.contributor.googleauthorKim, Hyungseup-
dc.contributor.googleauthorKo, Youngwoon-
dc.contributor.googleauthorMun, Yeongjin-
dc.contributor.googleauthorLee, Byeoncheol-
dc.contributor.googleauthorKim, Dong Kyue-
dc.contributor.googleauthorChoi, Byong-Deok-
dc.contributor.googleauthorKim, Ji-Hoon-
dc.contributor.googleauthorKo, Hyoungho-
dc.relation.code2018005222-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.piddqkim-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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