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Model-Based Test Suite Generation Using Mutation Analysis for Fault Localization

Title
Model-Based Test Suite Generation Using Mutation Analysis for Fault Localization
Author
임동진
Keywords
model-based testing; automatic test-case generation; mutation-based testing; fault localization; search-based algorithm
Issue Date
2019-08
Publisher
MDPI
Citation
APPLIED SCIENCES-BASEL, v. 9, No. 17, Article no. 3492
Abstract
Fault localization techniques reduce the effort required when debugging software, as revealed by previous test cases. However, many test cases are required to reduce the number of candidate fault locations. To overcome this disadvantage, various methods were proposed to reduce fault-localization costs by prioritizing test cases. However, because a sufficient number of test cases is required for prioritization, the test-case generation cost remains high. This paper proposes a test-case generation method using a state chart to reduce the number of test suites required for fault localization, minimizing the test-case generation and execution times. The test-suite generation process features two phases: fault-detection test-case generation and fault localization in the test cases. Each phase uses mutation analysis to evaluate test cases; the results are employed to improve the test cases according to the objectives of each phase, using genetic algorithms. We provide useful guidelines for application of a search-based mutational method to a state chart; we show that the proposed method improves fault-localization performance in the test-suite generation phase.
URI
https://www.mdpi.com/2076-3417/9/17/3492https://repository.hanyang.ac.kr/handle/20.500.11754/117788
ISSN
2076-3417
DOI
10.3390/app9173492
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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