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dc.contributor.author이선영-
dc.date.accessioned2019-08-22T07:32:34Z-
dc.date.available2019-08-22T07:32:34Z-
dc.date.issued2006-10-
dc.identifier.citationMATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v. 434, No. 1-2, Page. 160-165en_US
dc.identifier.issn0921-5093-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0921509306012950-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/108979-
dc.description.abstractA unique approach introducing sialon polytypoids as a functionally graded material (FGM) bonding has been used to join silicon nitride and alumina. The various multilayered FGM samples ranging from 3 to 20 layers were sintered to fabricate a crack-free joining of heterogeneous ceramics. To calculate thermal stresses for the various multilayered FGM samples, the finite element analysis program (FEAP) was used. These analyses results matched experimental results and showed why some samples had large residual stresses that resulted in fracture. Moreover, the electron probe X-ray microanalysis (EPMA) from a crack-free FGM sample had a smooth concentration profile, which verifies the interface diffusion during sintering at each graded layer and confirms a successful joining. (c) 2006 Elsevier B.V. All rights reserved.en_US
dc.description.sponsorshipThis work was supported by the Director, Office of Basic Energy Sciences, Division of Materials Sciences of the United States Department of Energy, Micro Thermal System Research Center and second stage Brain Korea 21 of Seoul National University, and Research Institute of Engineering and Technology at Hanyang University. The authors would like to thank Dr. Terrance Becker and Dr. Rowland Cannon who passed away recently at LBNL for help in setting up the FEAP program to calculate residual stress.en_US
dc.language.isoen_USen_US
dc.publisherELSEVIER SCIENCE SAen_US
dc.subjectfunctionally graded material (FGM)en_US
dc.subjectsialon polytypoiden_US
dc.subjectthermal stressen_US
dc.subjectelectron probe X-ray microanalysis (EPMA)en_US
dc.titleEffect of functionally graded material layers on the residual stress of polytypoidally joined Si3N4-Al2O3en_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.msea.2006.06.139-
dc.relation.journalMATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING-
dc.contributor.googleauthorLee, Caroline S.-
dc.contributor.googleauthorAhn, Sung-Hoon-
dc.contributor.googleauthorDeJonghe, Lutgard C.-
dc.contributor.googleauthorThomas, Gareth-
dc.relation.code2009214148-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MATERIALS SCIENCE AND CHEMICAL ENGINEERING-
dc.identifier.pidsunyonglee-
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COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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