Electrode Dependence of Resistance Switching in NiO Thin Films
- Title
- Electrode Dependence of Resistance Switching in NiO Thin Films
- Author
- 김동욱
- Keywords
- resistance switching; NiO; current-voltage measurement
- Issue Date
- 2007-10
- Publisher
- KOREAN PHYSICAL SOC
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 51, Page. S88-S91
- Abstract
- We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, An and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-voltage (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures axe nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.
- URI
- http://www.jkps.or.kr/journal/view.html?uid=9045&vmd=Fullhttps://repository.hanyang.ac.kr/handle/20.500.11754/106983
- ISSN
- 0374-4884; 1976-8524
- DOI
- 10.3938/jkps.51.88
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > ETC
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML