402 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author김병훈-
dc.date.accessioned2019-05-27T06:36:19Z-
dc.date.available2019-05-27T06:36:19Z-
dc.date.issued2015-02-
dc.identifier.citationEXPERT SYSTEMS WITH APPLICATIONS, v. 42, No. 3, Page. 1479-1486en_US
dc.identifier.issn0957-4174-
dc.identifier.issn1873-6793-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0957417414005338-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/106021-
dc.description.abstractIdentifying important patents helps to drive business growth and focus investment. In the past, centrality measures such as degree centrality and betweenness centrality have been applied to identify influential or important patents in patent citation networks. How such a complex process like technological change can be analyzed is an important research topic. However, no existing centrality measure leverages the powerful graph kernels for this end. This paper presents a new centrality measure based on the change of the node similarity matrix after leveraging graph kernels. The proposed approach provides a more robust understanding of the identification of influential nodes, since it focuses on graph structure information by considering direct and indirect patent citations. This study begins with the premise that the change of similarity matrix that results from removing a given node indicates the importance of the node within its network, since each node makes a contribution to the similarity matrix among nodes. We calculate the change of the similarity matrix norms for a given node after we calculate the singular values for the case of the existence and the case of nonexistence of that node within the network. Then, the node resulting in the largest change (i.e., decrease) in the similarity matrix norm is considered to be the most influential node. We compare the performance of our proposed approach with other widely-used centrality measures using artificial data and real-life U.S. patent data. Experimental results show that our proposed approach performs better than existing methods. (C) 2014 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.publisherPERGAMON-ELSEVIER SCIENCE LTDen_US
dc.subjectCentrality measureen_US
dc.subjectPatent citation networken_US
dc.subjectGraph kernelen_US
dc.subjectSimilarity matrixen_US
dc.subjectMatrix normen_US
dc.titleGraph kernel based measure for evaluating the influence of patents in a patent citation networken_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.eswa.2014.08.051-
dc.relation.journalEXPERT SYSTEMS WITH APPLICATIONS-
dc.contributor.googleauthorRodriguez, Andrew-
dc.contributor.googleauthorKim, Byunghoon-
dc.contributor.googleauthorLee, Jae-Min-
dc.contributor.googleauthorCoh, Byoung-Yul-
dc.contributor.googleauthorJeong, Myong K.-
dc.relation.code2015010289-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF INDUSTRIAL AND MANAGEMENT ENGINEERING-
dc.identifier.pidbyungkim-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > INDUSTRIAL AND MANAGEMENT ENGINEERING(산업경영공학과) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE