Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function
- Title
- Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function
- Author
- 박성주
- Keywords
- Bayesian theorem; counterfeit ICs; hardware security; physically unclonable function; scan design
- Issue Date
- 2018-04
- Publisher
- 대한전자공학회
- Citation
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v. 18, No. 2, Page. 218-226
- Abstract
- Scan flip-flop based physically unclonable function (SCAN-PUF) has been proposed to protect integrated circuits (ICs) from security threats such as unauthorized access and IC cloning. In this paper, we propose an efficient SCAN-PUF technique that improves the uniqueness of responses with low cost overhead. The proposed SCAN-PUF first determines an optimal number of power-up state observations and then selects scan flip-flops as the PUF elements (P-ELEMENTs) through a given number of observations. A Bayesian model is adopted to evaluate the reliability of the P-ELEMENTs, and a grouped P-ELEMENT selection method is introduced to obtain more P-ELEMENTs than a predetermined threshold. To evaluate the proposed SCAN-PUF, we observed the power-up states of scan flip-flops from 15 chips fabricated using the 65-nm CMOS technology. The optimal number of observations is determined according to the reliability of the P-ELEMENTs, and the reliability, randomness, and uniqueness of the responses are then analyzed.
- URI
- http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE07420101https://repository.hanyang.ac.kr/handle/20.500.11754/105478
- ISSN
- 1598-1657
- DOI
- 10.5573/JSTS.2018.18.2.218
- Appears in Collections:
- COLLEGE OF COMPUTING[E](소프트웨어융합대학) > COMPUTER SCIENCE(소프트웨어학부) > Articles
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