Eye-diagram; frequency-variant characteristics; signal integrity; signal transient response; transmission line
Issue Date
2009-11
Publisher
IEEE
Citation
2009 International SoC Design Conference (ISOCC), Page. 436-439
Abstract
A new efficient and accurate eye diagram determination technique is presented. In order to estimate the worst case eye diagram, bit streams which may induce the worst ISI (inter symbol interference) are determined. Then the output responses for worst case bit streams are determined by using fast Fourier transform technique. The proposed technique is compared with SPICE simulation that employs PRBS (pseudorandom bit sequence) input signals.