Test Access Mechanism for Automotive Chips through Vehicular Control Networks

Abstract

Modern automobiles house many ECUs (Electronic Control Units), which are connected through VCNs (Vehicle Control Networks). Typically, integrated circuits are tested for structural defects, which could occur during fabrication. In general, vehicular ECUs are tested for functional operation. However, due to vibrations, high temperature, etc., defects might be developed in ICs. This work presents a test access mechanism for in-vehicle ICs based on VCNs. The proposed test access mechanism complies with protocols of VCNs and allows the access to the on-chip circuitry.