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Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2019-04-23T02:48:30Z | - |
| dc.date.available | 2019-04-23T02:48:30Z | - |
| dc.date.issued | 2016-07 | - |
| dc.identifier.citation | IEICE ELECTRONICS EXPRESS, v. 13, No. 14, Article no. 20160314 | en_US |
| dc.identifier.issn | 1349-2543 | - |
| dc.identifier.uri | https://www.jstage.jst.go.jp/article/elex/13/14/13_13.20160314/_article/-char/ja/ | - |
| dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/102561 | - |
| dc.description.abstract | Due to ever-increasing gap between (1) the tester-channel and scan-shift frequencies, and (2) the wafer-level and package-level test frequencies, the tester-channel frequency is underutilized for stacked-ICs. Thus, we present a novel time-multiplexed test access architecture for SICs that complies with P1838 and it significant reduces test time, which reduction is observed on a synthetic SIC based on ITC'02 benchmark SoCs. | en_US |
| dc.description.sponsorship | This research was supported by the MOTIE (Ministry of Trade, Industry & Energy (201500000001436) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device. The work of the first author is in part supported by the Higher Education Commission (HEC), Pakistan. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG | en_US |
| dc.subject | 3D test access architecture | en_US |
| dc.subject | design-for-testability | en_US |
| dc.subject | stacked-ICs | en_US |
| dc.subject | OPTIMIZATION | en_US |
| dc.subject | SOCS | en_US |
| dc.subject | ICS | en_US |
| dc.title | Time-multiplexed test access architecture for stacked integrated circuits | en_US |
| dc.type | Article | en_US |
| dc.relation.no | 14 | - |
| dc.relation.volume | 13 | - |
| dc.identifier.doi | 10.1587/elex.13.20160314 | - |
| dc.relation.page | 1-6 | - |
| dc.relation.journal | IEICE ELECTRONICS EXPRESS | - |
| dc.contributor.googleauthor | Ansari, Muhammad Adil | - |
| dc.contributor.googleauthor | Jung, Jihun | - |
| dc.contributor.googleauthor | Kim, Dooyoung | - |
| dc.contributor.googleauthor | Park, Sungju | - |
| dc.relation.code | 2016009876 | - |
| dc.sector.campus | E | - |
| dc.sector.daehak | COLLEGE OF COMPUTING[E] | - |
| dc.sector.department | DIVISION OF COMPUTER SCIENCE | - |
| dc.identifier.pid | paksj | - |
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- COLLEGE OF COMPUTING[E](소프트웨어융합대학) > COMPUTER SCIENCE(소프트웨어학부) > Articles
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