Efficient Diagnosis Technique for Aging Defects on Automotive Semiconductor Chips
- Title
- Efficient Diagnosis Technique for Aging Defects on Automotive Semiconductor Chips
- Author
- 박성주
- Keywords
- aging monitoring; scan flip-flop; on-line test
- Issue Date
- 2015-05
- Publisher
- IEEE
- Citation
- 2015 20th IEEE European Test Symposium (ETS), Article no. 7138767
- Abstract
- The semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches.
- URI
- http://ieeexplore.ieee.org/document/7138767https://repository.hanyang.ac.kr/handle/20.500.11754/100649
- ISBN
- 978-1-4799-7603-4
- ISSN
- 1530-1877; 1558-1780
- DOI
- 10.1109/ETS.2015.7138767
- Appears in Collections:
- ETC[S] > 연구정보
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML