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Local Ferroelectric Responses of Epitaxial PbTiO3 Thin Films to Heated Atomic Force Microscopy

Title
Local Ferroelectric Responses of Epitaxial PbTiO3 Thin Films to Heated Atomic Force Microscopy
Author
김우희
Keywords
Ferroelectric domain size; Heated AFM; Activation energy
Issue Date
2016-04
Publisher
ELSEVIER SCIENCE BV
Citation
MATERIALS LETTERS, v. 168, Page. 134-137
Abstract
We report the dependence of ferroelectric domain size of epitaxially grown PbTiO3 (PTO) thin films on Nb-doped SrTiO3 substrate to temperature. PbTiO3 exhibited well-defined ferroelectricity with a high remnant polarization of about 60 mu C/cm(2). Based on piezoelectric force microscopy (PFM) measurements, we confirmed that the ferroelectric domain size of PbTiO3 thin films depends on electric field and temperature. The minimum ferroelectric domain size could be reduced by the locally heated atomic force microscopy (h-AFM) technique. (C) 2016 Elsevier B.V. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S0167577X16300362https://repository.hanyang.ac.kr/handle/20.500.11754/100545
ISSN
0167-577X; 1873-4979
DOI
10.1016/j.matlet.2016.01.036
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MATERIALS SCIENCE AND CHEMICAL ENGINEERING(재료화학공학과) > Articles
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