274 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author김영호-
dc.date.accessioned2019-02-12T06:07:12Z-
dc.date.available2019-02-12T06:07:12Z-
dc.date.issued2016-10-
dc.identifier.citationJOURNAL OF ADHESION, v. 94, NO. 1, Page. 1-14en_US
dc.identifier.issn0021-8464-
dc.identifier.issn1545-5823-
dc.identifier.urihttps://www.tandfonline.com/doi/full/10.1080/00218464.2016.1219950-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/98873-
dc.description.abstractThe peel adhesion between two different electroless-plated Cu layers and polymer substrates was studied. Cu was electroless-plated onto polymer substrates using two different commercial solutions with different compositions. The adhesion strength between the electroless Cu layers and polymer substrates was measured with the 90 degrees peel test. The adhesion was influenced by the coverage, grain size, and the thickness of the electroless Cu layer. Poor coverage of the electroless Cu layer increased the density of the pores at the interface between the Cu layer and the substrates, thereby degrading the adhesion strength because of a decrease in the contact area. In addition, the electroless Cu layers with larger nodules and larger grains were softer and had higher peel adhesion since the soft and ductile Cu layer promoted a greater amount of plastic deformation during the peel test. This led to enhanced peel adhesion. Finally, as the thickness of the electroless Cu layer increased, the peel adhesion decreased. The thicker Cu layers are not easily bent. Poor bending of the Cu layer induced less plastic deformation, causing a decrease in the peel adhesion. In conclusion, soft and thin electroless Cu layers with greater coverage are preferred in order to obtain good adhesion.en_US
dc.description.sponsorshipThis research was financially supported by Daeduck Electronics Co. Ltd.en_US
dc.language.isoenen_US
dc.publisherTAYLOR & FRANCIS LTDen_US
dc.subject90 degrees peel testen_US
dc.subjectadhesionen_US
dc.subjectmetalsen_US
dc.subjectmicrostructure of copper layeren_US
dc.subjectpackagingen_US
dc.subjectpeelen_US
dc.titleA peel adhesion study of electroless Cu layers on polymer substratesen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume94-
dc.identifier.doi10.1080/00218464.2016.1219950-
dc.relation.page1-14-
dc.relation.journalJOURNAL OF ADHESION-
dc.contributor.googleauthorKim, Sun-Chul-
dc.contributor.googleauthorSeong, Haseob-
dc.contributor.googleauthorAhn, Key-one-
dc.contributor.googleauthorChoi, Dong Joo-
dc.contributor.googleauthorLee, Ja-Yeon-
dc.contributor.googleauthorKo, Young-Ju-
dc.contributor.googleauthorYoon, Suk-beom-
dc.contributor.googleauthorSeo, Mi-lim-
dc.contributor.googleauthorKim, Young-Ho-
dc.relation.code2016003454-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidkimyh-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE