Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy

Title
Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy
Author
김수은
Keywords
Lateral Force Microscopy; LFM; Friction; Gain; Scan speed
Issue Date
2018-08
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 73, No. 3, Page. 388-391
Abstract
Lateral force microscopy (LFM) is used to examine friction at the nanoscale. Although the friction at the tip-sample contact measured by LFM can provide extensive information beyond the friction force itself, such as the crystallographic orientation, the presence of defects, etc., there have been many contradictory reports regarding friction coefficients, nanoscale friction laws, etc. obtained by this technique. Here we investigate the effect of scan rate and gain on the LFM frictional force measurements. We show that the ratio of friction measured on SiO2 to friction measured on graphene can vary from about 1 to approximately 9.2 depending on the combination of these parameters. We discuss how to optimize the associated scan parameters to obtain reliable friction data at the nanoscale.
URI
https://link.springer.com/article/10.3938/jkps.73.388http://repository.hanyang.ac.kr/handle/20.500.11754/81291
ISSN
0374-4884
DOI
10.3938/jkps.73.388
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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