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dc.contributor.author전형탁-
dc.date.accessioned2018-09-27T04:53:29Z-
dc.date.available2018-09-27T04:53:29Z-
dc.date.issued2016-08-
dc.identifier.citationACS PHOTONICS, v. 3, NO. 8, Page. 1440-1445en_US
dc.identifier.issn2330-4022-
dc.identifier.urihttps://pubs.acs.org/doi/10.1021/acsphotonics.6b00103-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/76183-
dc.description.abstractWe investigated optical nonlinearity induced by electron tunneling through an insulating vertical gap between metals, both at terahertz frequency and at near-infrared frequency. We adopted graphene and alumina layers as gap materials to form gap widths of 3 angstrom and 1.5 nm, respectively. Transmission measurements show that tunneling-induced transmittance changes from strong fields at the gaps can be observed with relatively weak incident fields at terahertz frequency due to high field enhancement, whereas nonlinearity at the near-infrared frequency is restricted by laser-induced metal damages. Even when the same level of tunneling currents occurs at both frequencies, transmittance in the terahertz regime decreases much faster than that in the near-infrared regime. An equivalent circuit model regarding the tunneling as a resistance component reveals that strong terahertz nonlinearity is due to much smaller displacement currents relative to tunneling currents, also explaining small nonlinearity of the near-infrared regime with orders of magnitude larger displacement currents.en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIP: NRF-2015R1A3A2031768, NRF-2011-0017494, WCI 2011-001) (MOE: BK21 Plus Program-21A20131111123).en_US
dc.language.isoenen_US
dc.publisherAMER CHEMICAL SOCen_US
dc.subjectterahertz nonlinearityen_US
dc.subjectquantum tunnelingen_US
dc.subjectangstrom gapen_US
dc.subjectmetal−insulator−metalen_US
dc.subjectgrapheneen_US
dc.subjectaluminum oxideen_US
dc.titleColossal Terahertz Nonlinearity in Angstrom- and Nanometer-Sized Gapsen_US
dc.typeArticleen_US
dc.relation.no8-
dc.relation.volume3-
dc.identifier.doi10.1021/acsphotonics.6b00103-
dc.relation.page1440-1445-
dc.relation.journalACS PHOTONICS-
dc.contributor.googleauthorHan, Sanghoon-
dc.contributor.googleauthorKim, Joon-Yeon-
dc.contributor.googleauthorKang, Taehee-
dc.contributor.googleauthorBahk, Young-Mi-
dc.contributor.googleauthorRhie, Jiyeah-
dc.contributor.googleauthorKang, Bong Joo-
dc.contributor.googleauthorKim, Yong Seung-
dc.contributor.googleauthorPark, Joohyun-
dc.contributor.googleauthorKim, Won Tae-
dc.contributor.googleauthorJeon, Hyeongtag-
dc.relation.code2016009637-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidhjeon-
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COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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