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D'Arsonval Movement-Based Precise Milligram Force Control for Individual Touch Sense Assessment

Title
D'Arsonval Movement-Based Precise Milligram Force Control for Individual Touch Sense Assessment
Author
최영진
Keywords
Active von Frey (AVF); contact (or touching) force; D'Arsonval movement; electric current control; light touch threshold (LTT); mechanoreceptor; vibration perception threshold (VPT)
Issue Date
2017-02
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v. 64, No. 2, Page. 1534-1543
Abstract
Humans cannot feel the contact (or touching) force when it is too weak and falls in a specific range. For instance, if it is between several dozens and hundreds of milligram force, then humans may not be able to distinguish whether the object has come in contact with their skin or not. The minimum contact force that the human can feel is called the light touch threshold (LTT). This paper presents a novel apparatus to measure the LTT, which is referred to as an active von Frey (AVF) in this paper. To the best of the authors' knowledge, an LTT measurement device with a precise weak force range is proposed for the first time in this paper. It is possible for the AVF to provide the touching force range from 1 to 400 [mgf]. In order to provide a precise touching force for individual subjects, D'Arsonval movement is chosen as an actuator to rotate the touching AVF pin. Both an electric current applied to the D'Arsonval movement and a rotational angle of the AVF pin are utilized to calculate the touching force by the electromechanical statics. As outcomes of this paper, we found out that the LTTs are very different from individual to individual and they are approximately proportional to the vibration perception thresholds with the results of 13 participants. It is expected that the AVF for LTT measurement can be utilized to design or control the personalized haptic device and, furthermore, to research the human nervous system diseases.
URI
https://ieeexplore.ieee.org/abstract/document/7574318/http://repository.hanyang.ac.kr/handle/20.500.11754/71763
ISSN
0278-0046; 1557-9948
DOI
10.1109/TIE.2016.2612620
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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