Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김영호 | - |
dc.date.accessioned | 2018-04-30T06:40:31Z | - |
dc.date.available | 2018-04-30T06:40:31Z | - |
dc.date.issued | 2013-05 | - |
dc.identifier.citation | IEEE 63rd Electronic Components and Technology Conference, 2013, P.785-789 | en_US |
dc.identifier.isbn | 978-1-4799-0233-0 | - |
dc.identifier.isbn | 978-1-4799-0232-3 | - |
dc.identifier.issn | 0569-5503 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/6575662/ | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/71086 | - |
dc.description.abstract | A 20 μm pitch flip-chip bonding with Sn/Cu bumps and nonconductive adhesives (NCAs) was developed to satisfy the requirement for high density electronic packaging. The Sn/Cu bumps of a 20 μm pitch are peripheral distributed in a line. The bonding process was performed at 150°C for 10 s using three commercial NCAs. All the joints were successfully fabricated with NCAs, and have similar contact resistance values, regardless of NCA type. To evaluate the reliability, a thermal cycling (T/C) test (-55°C/125°C, 1000 cycles) and a temperature and humidity (T&H) test (70°C/95% RH, 1000 h) were performed. The effect of NCA type on reliability was investigated. NCA, which has lower moisture absorption and a lower coefficient of thermal expansion, had the best performance in a reliability test. Our results showed that bonding using Sn/Cu bumps and NCA can be applied in ultra-fine pitch (less than 20 μm) flip-chip bonding if the proper NCA is selected. | en_US |
dc.language.iso | other | en_US |
dc.publisher | IEEE | en_US |
dc.subject | Flip-chip devices, | en_US |
dc.subject | Joints | en_US |
dc.subject | Tin | en_US |
dc.subject | Reliability | en_US |
dc.subject | Bonding | en_US |
dc.subject | Moisture | en_US |
dc.subject | Silicon compounds | en_US |
dc.title | Development of Highly Reliable Flip-chip Bonding Technology using Non-conductive Adhesives (NCAs) for 20 um Pitch Application | en_US |
dc.type | Article | en_US |
dc.relation.volume | 63 | - |
dc.identifier.doi | 10.1109/ECTC.2013.6575662 | - |
dc.relation.page | 785-789 | - |
dc.contributor.googleauthor | Kim, Sun-Chul | - |
dc.contributor.googleauthor | Hong, Myung-Hwan | - |
dc.contributor.googleauthor | Lee, Ji-Hyun | - |
dc.contributor.googleauthor | Kim, Young-Ho | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF MATERIALS SCIENCE AND ENGINEERING | - |
dc.identifier.pid | kimyh | - |
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