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dc.contributor.author정두석-
dc.date.accessioned2018-04-20T03:35:45Z-
dc.date.available2018-04-20T03:35:45Z-
dc.date.issued2014-10-
dc.identifier.citationOPTICS EXPRESS, 22, 21, pp.A1431-A1439, 2014en_US
dc.identifier.issn1094-4087-
dc.identifier.urihttps://www.osapublishing.org/oe/abstract.cfm?uri=oe-22-S6-A1431-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/70302-
dc.description.abstractThe use of ultrathin c-Si (crystalline silicon) wafers thinner than 20 mu m for solar cells is a very promising approach to realize dramatic reduction in cell cost. However, the ultrathin c-Si requires highly effective light trapping to compensate optical absorption reduction. Conventional texturing in micron scale is hardly applicable to the ultrathin c-Si wafers; thus, nano scale texturing is demanded. In general, nanotexturing is inevitably accompanied by surface area enlargements, which must be minimized in order to suppress surface recombination of minority carriers. In this study, we demonstrate using optical simulations that periodic c-Si nanodisk arrays of short heights less than 200 nm and optimal periods are very useful in terms of light trapping in the ultrathin c-Si wafers while low surface area enlargements are maintained. Double side texturing with the nanodisk arrays leads to over 90% of the Lambertian absorption limit while the surface area enlargement is kept below 1.5. (C) 2014 Optical Society of Americaen_US
dc.description.sponsorshipThis work was financially supported by Korea Institute of Science and Technology (grant No. 2E24872). I. Kim acknowledges KUUC (KIST-UNIST-Ulsan Center for Convergent Materials) for the financial support.en_US
dc.language.isoenen_US
dc.publisherOPTICAL SOC AMER, 2010 MASSACHUSETTS AVE NW, WASHINGTON, DC 20036 USAen_US
dc.subjectSOLAR-CELLSen_US
dc.subjectABSORPTION ENHANCEMENTen_US
dc.subjectPHOTOVOLTAICSen_US
dc.subjectNANOSTRUCTURESen_US
dc.subjectANTIREFLECTIONen_US
dc.subjectEFFICIENCYen_US
dc.titleSilicon nanodisk array design for effective light trapping in ultrathin c-Sien_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.22.0A1431-
dc.relation.journalOPTICS EXPRESS-
dc.contributor.googleauthorKim, I-
dc.contributor.googleauthorJeong, DS-
dc.contributor.googleauthorLee, WS-
dc.contributor.googleauthorKim, WM-
dc.contributor.googleauthorLee, TS-
dc.contributor.googleauthorLee, DK-
dc.contributor.googleauthorSong, JH-
dc.contributor.googleauthorKim, JK-
dc.contributor.googleauthorLee, KS-
dc.relation.code2014037075-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.piddooseokj-


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