62 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author권오경-
dc.date.accessioned2018-04-19T22:59:36Z-
dc.date.available2018-04-19T22:59:36Z-
dc.date.issued2011-03-
dc.identifier.citationJapanese Journal of Applied Physics, 2011, 50(3)en_US
dc.identifier.issn0021-4922-
dc.identifier.urihttp://iopscience.iop.org/article/10.1143/JJAP.50.03CC01/meta-
dc.description.abstractIn this paper, we propose a driving method for compensating the electrical instability of hydrogenated amorphous silicon (a-Si: H) thin film transistors (TFTs) and the luminance degradation of organic light-emitting diode (OLED) devices for large active matrix OLED (AMOLED) displays. The proposed driving method senses the electrical characteristics of a-Si: H TFTs and OLEDs using current integrators and compensates them by an external compensation method. Threshold voltage shift is controlled a using negative bias voltage. After applying the proposed driving method, the measured error of the maximum emission current ranges from -1.23 to +1.59 least significant bit (LSB) of a 10-bit gray scale under the threshold voltage shift ranging from -0.16 to 0.17 V. (c) 2011 The Japan Society of Applied Physicsen_US
dc.description.sponsorshipThis research was supported by a grant (F0004060) from the Information Display R&D Center, one of the Knowledge Economy Frontier R&D programs funded by the Ministry of Knowledge Economy of the Korean government.en_US
dc.language.isoenen_US
dc.publisherIOP Publishing LTDen_US
dc.subjectAMOLED DISPLAYSen_US
dc.subjectDEGRADATIONen_US
dc.subjectDEVICESen_US
dc.subjectTIMEen_US
dc.titleDriving Method for Compensating Reliability Problem of Hydrogenated Amorphous Silicon Thin Film Transistors and Image Sticking Phenomenon in Active Matrix Organic Light-Emitting Diode Displaysen_US
dc.typeArticleen_US
dc.relation.volume50-
dc.identifier.doi10.1143/JJAP.50.03CC01-
dc.relation.page1-1-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.contributor.googleauthorShin, MS-
dc.contributor.googleauthorJo, YR-
dc.contributor.googleauthorKwon, OK-
dc.relation.code2011217131-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE