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dc.contributor.author권오경-
dc.date.accessioned2018-04-16T04:24:58Z-
dc.date.available2018-04-16T04:24:58Z-
dc.date.issued2012-03-
dc.identifier.citationIEEE Electron Device Letters, 2012, 33(3), P.402-404en_US
dc.identifier.issn0741-3106-
dc.identifier.urihttps://ieeexplore.ieee.org/document/6151012/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/67844-
dc.description.abstractA new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 mu W at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 x 768) panel. The power consumption is less than 11.9% of the previously reported results.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectDepletion modeen_US
dc.subjectIn-Ga-Zn-Oen_US
dc.subjectscan driveren_US
dc.subjectthin-film transistor (TFT)en_US
dc.titleA Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTsen_US
dc.typeArticleen_US
dc.relation.no3-
dc.relation.volume33-
dc.identifier.doi10.1109/LED.2011.2181482-
dc.relation.page402-404-
dc.relation.journalIEEE ELECTRON DEVICE LETTERS-
dc.contributor.googleauthorYoo, S. J.-
dc.contributor.googleauthorHong, S. J.-
dc.contributor.googleauthorKang, J. S.-
dc.contributor.googleauthorIn, H. J.-
dc.contributor.googleauthorKwon, O. K.-
dc.relation.code2012203822-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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