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A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs

Title
A Low-Power Single-Clock-Driven Scan Driver Using Depletion-Mode a-IGZO TFTs
Author
권오경
Keywords
Depletion mode; In-Ga-Zn-O; scan driver; thin-film transistor (TFT)
Issue Date
2012-03
Publisher
IEEE
Citation
IEEE Electron Device Letters, 2012, 33(3), P.402-404
Abstract
A new low-power scan driver using amorphous In-Ga-Zn-O (a-IGZO) thin-film transistor (TFT) is proposed. The proposed scan driver employs only one-clock signal and connects power supply voltage to the drain node of pull-up TFTs in the output stage to reduce the power consumption. The measured power consumption of the proposed scan driver of ten stages is 265 mu W at an output voltage of 20 V and a clock frequency of 46.1 kHz, which is the driving condition of the extended graphics array (1024 x 768) panel. The power consumption is less than 11.9% of the previously reported results.
URI
https://ieeexplore.ieee.org/document/6151012/http://hdl.handle.net/20.500.11754/67844
ISSN
0741-3106
DOI
10.1109/LED.2011.2181482
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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