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Low-Power and Small-Sized Scan Driver Using Amorphous Oxide TFTs

Title
Low-Power and Small-Sized Scan Driver Using Amorphous Oxide TFTs
Author
권오경
Keywords
THIN film transistors; AMORPHOUS semiconductors; INDIUM gallium zinc oxide; AMORPHOUS substances; ENERGY consumption
Issue Date
2012-06
Publisher
Wiley-Blackwell
Citation
SID Symposium Digest of Technical Papers, 2012, 43(1), P.1108-1111(4)
Abstract
This paper presents a low‐power and small‐sized scan driver using amorphous indium‐gallium‐zinc‐oxide (a‐IGZO) thin‐film transistors (TFTs). Power consumption of the proposed scan driver is reduced by eliminating unnecessary charging current of the scan line and reducing the voltage swing of clock signals. In the proposed scan driver, area of the output stage, which requires large‐sized driving TFTs, is also reduced by merging TFTs for charging and discharging the scan line into one TFT and using non‐overlapping clock signals. Compared to the previous scan driver, power consumption and area of the output stage of the proposed scan driver is reduced by 21% and 40%, respectively. The proposed scan driver has power consumption of 27.4 μW per stage at the operating frequency of 46 kHz and the area per stage is 1153 × 192 μm2.
URI
http://onlinelibrary.wiley.com/doi/abs/10.1002/j.2168-0159.2012.tb05986.xhttp://hdl.handle.net/20.500.11754/67330
ISSN
0097-966X
DOI
10.1002/j.2168-0159.2012.tb05986.x
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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