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dc.contributor.author김영호-
dc.date.accessioned2018-03-27T07:57:58Z-
dc.date.available2018-03-27T07:57:58Z-
dc.date.issued2012-02-
dc.identifier.citationJOURNAL OF ELECTRONIC MATERIALS,APR. 2012,Vol.41,No.4, p763-p773(11p.)en_US
dc.identifier.issn0361-5235-
dc.identifier.issn1543-186X-
dc.identifier.urihttps://link.springer.com/article/10.1007%2Fs11664-012-1921-0-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/53120-
dc.description.abstractIntermetallic compound formation at the interface between Sn-3.0Ag-0.5Cu (SAC) solders and electroless nickel/electroless palladium/immersion gold (ENEPIG) surface finish and the mechanical strength of the solder joints were investigated at various Pd thicknesses (0 mu m to 0.5 mu m). The solder joints were fabricated on the ENEPIG surface finish with SAC solder via reflow soldering under various conditions. The (Cu,Ni)(6)Sn-5 phase formed at the SAC/ENEPIG interface after reflow in all samples. When samples were reflowed at 260A degrees C for 5 s, only (Cu,Ni)(6)Sn-5 was observed at the solder interfaces in samples with Pd thicknesses of 0.05 mu m or less. However, the (Pd,Ni)Sn-4 phase formed on (Cu,Ni)(6)Sn-5 when the Pd thickness increased to 0.1 mu m or greater. A thick and continuous (Pd,Ni)Sn-4 layer formed over the (Cu,Ni)(6)Sn-5 layer, especially when the Pd thickness was 0.3 mu m or greater. High-speed ball shear test results showed that the interfacial strengths of the SAC/ENEPIG solder joints decreased under high strain rate due to weak interfacial fracture between (Pd,Ni)Sn-4 and (Cu,Ni)(6)Sn-5 interfaces when the Pd thickness was greater than 0.3 mu m. In the samples reflowed at 260A degrees C for 20 s, only (Cu,Ni)(6)Sn-5 formed at the solder interfaces and the (Pd,Ni)Sn-4 phase was not observed in the solder interfaces, regardless of Pd thickness. The shear strength of the SAC/ENIG solder joints was the lowest of the joints, and the mechanical strength of the SAC/ENEPIG solder joints was enhanced as the Pd thickness increased to 0.1 mu m and maintained a nearly constant value when the Pd thickness was greater than 0.1 mu m. No adverse effect on the shear strength values was observed due to the interfacial fracture between (Pd,Ni)Sn-4 and (Cu,Ni)(6)Sn-5 since the (Pd,Ni)Sn-4 phase was already separated from the (Cu,Ni)(6)Sn-5 interface. These results indicate that the interfacial microstructures and mechanical strength of solder joints strongly depend on the Pd thickness and reflow conditions.en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation of Korea (NRF) Grant funded by the Korea Government (MEST) (No. 2011-0015735).en_US
dc.language.isoenen_US
dc.publisherSPRINGERen_US
dc.subjectPb-free solderen_US
dc.subjectENEPIGen_US
dc.subjectPd thicknessen_US
dc.subjectinterfacial microstructureen_US
dc.subjectmechanical strengthen_US
dc.titleEffect of Pd Thickness on the Interfacial Reaction and Shear Strength in Solder Joints Between Sn-3.0Ag-0.5Cu Solder and Electroless Nickel/Electroless Palladium/Immersion Gold (ENEPIG) Surface Finishen_US
dc.title.alternativeElectroless Palladiumen_US
dc.typeArticleen_US
dc.relation.no4-
dc.relation.volume41-
dc.identifier.doi10.1007/s11664-012-1921-0-
dc.relation.page763-773-
dc.relation.journalJOURNAL OF ELECTRONIC MATERIALS-
dc.contributor.googleauthorKim, YoungMin-
dc.contributor.googleauthorPark, Jin-Young-
dc.contributor.googleauthorKim, Young-Ho-
dc.relation.code2012205022-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidkimyh-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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