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COLLEGE OF ENGINEERING SCIENCES[E](공학대학)
ELECTRICAL ENGINEERING(전자공학부)
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Results 1-6 of 6 (Search time: 0.001 seconds).
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Issue Date
Title
Author(s)
2011-10
Mitigating the Effects of Large Multiple Cell Upsets (MCUs) in Memories
백상현
2011-03
Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations
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2011-04
Multiple cell upsets tolerant content-addressable memory
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2011-04
AC-DC factor sensitivity for DRAM components lifetime under hot-carrier injection
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2011-07
DRAM failure cases under hot-carrier injection
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2011-06
Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors
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DRAM
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hot-carrier injection
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pumped voltage
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AC-DC Factor
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comparison cell
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decaying ratio
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Error correcting code
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Error-correcting codes
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evaluation time
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Fault-tolerant memory
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