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Showing results 8 to 12 of 12

Issue DateTitleAuthor(s)
2016-11Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery김병훈
2015-02A regularized singular value decomposition-based approach for failure pattern classification on fail bitmap in a DRAM Wafer김병훈
2016-02Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps김병훈
2017-10Two-phase edge outlier detection method for technology opportunity discovery김병훈
2017-09실물옵션 기반 기술가치 평가모델 정교화와 변동성 유효구간에 관한 연구김병훈

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