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Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments

Title
Atomic structural variations of [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments
Author
김태환
Keywords
ZnO; Si; Atomic structure; Grain boundary
Issue Date
2011-03
Publisher
Elsevier Science B.V
Citation
Applied Surface Science, 2011, 257(11), P.4817-4820
Abstract
ZnO thin films were deposited on n-Si substrates by using plasma-assisted molecular beam epitaxy. Plane-view zero-loss energy filtered transmission electron microscopy (TEM) images showed that the grain boundaries between large and small grains changed from the curve to the straight shape during ZnO grain growth. The [0 0 0 1]-tilt grain boundary of as-grown ZnO thin films changed from the zigzag facet planes into the symmetric tilt grain boundary through the asymmetric tilt grain boundary with periodic {0 1 (1) over bar 0}/{3 5 (8) over bar 0} flat planes. Such an atomic structural variation of grain boundary changes from curved grain boundaries to flat shape was due to decrease of total boundary energy during grain growth. The atomic structural variations of the [0 0 0 1]-tilt grain boundaries during ZnO grain growth occurred by thermal treatments are described on the basis of the TEM images. (c) 2011 Elsevier B.V. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S016943321001812X?via%3Dihub
ISSN
0169-4332; 0169-4332
DOI
10.1016/j.apsusc.2010.12.083
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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