373 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author김태환-
dc.date.accessioned2018-03-23T07:28:47Z-
dc.date.available2018-03-23T07:28:47Z-
dc.date.issued2014-11-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS, 권: 53, 호: 11en_US
dc.identifier.issn0021-4922-
dc.identifier.issn1347-4065-
dc.identifier.urihttp://iopscience.iop.org/article/10.7567/JJAP.53.115201/meta-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/51517-
dc.description.abstractHigh-resolution transmission electron microscopy (HRTEM) images showed that the lattice distortion of as-grown InGaP/InGaAIP multiple quantum wells (MQWs) appeared to be due to the small thickness of the alloyed layers, and that their distortion was relaxed owing to the high atomic mobility. High-angle annular dark-field scanning transmission electron microscopy images demonstrated that the chemical intermixing of Ga and Al atoms between the InAlP and InGaP alloy layers due to thermal annealing relaxed the stress of the InGaAIP layer. The atomic arrangements of the as-grown and annealed MQWs are described on the basis of the experimental results. (C) 2014 The Japan Society of Applied Physicsen_US
dc.description.sponsorshipThis research was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2013-016467) and also by the Korea Basic Science Institute grant to J.-G. Kim (D33804).en_US
dc.language.isoenen_US
dc.publisherIOP PUBLISHING LTDen_US
dc.titleAtomic variations in digital alloy InGaP/InGaAIP multiple quantum wells due to thermal treatmenten_US
dc.title.alternativeInGaAIP multiple quantum wells due to thermal treatmenten_US
dc.typeArticleen_US
dc.relation.no11-
dc.relation.volume53-
dc.identifier.doi10.7567/JJAP.53.115201-
dc.relation.page1-5-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.contributor.googleauthorShin, Jae Won-
dc.contributor.googleauthorJeong, Hu Young-
dc.contributor.googleauthorYoo, Seung-
dc.contributor.googleauthorLee, Seok-Hoon-
dc.contributor.googleauthorHan, Jun Hee-
dc.contributor.googleauthorLee, Jeong Yong-
dc.contributor.googleauthorAhn, Jun Sung-
dc.contributor.googleauthorPark, Chang Young-
dc.contributor.googleauthorPark, Kwang Wook-
dc.contributor.googleauthorKim, Tae Whan-
dc.relation.code2014032123-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidtwk-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE