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dc.contributor.author권오경-
dc.date.accessioned2018-03-20T08:33:24Z-
dc.date.available2018-03-20T08:33:24Z-
dc.date.issued2014-05-
dc.identifier.citationSID International Symposium. Digest of Technical Papers, Vol.45, No.1, pp.1009-1012en_US
dc.identifier.issn0097-966X-
dc.identifier.issn2168-0159-
dc.identifier.urihttp://onlinelibrary.wiley.com/doi/10.1002/j.2168-0159.2014.tb00262.x/full-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/49816-
dc.description.abstractIn this paper, a low-power scan driver using depletion-mode amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) is proposed for high-resolution displays. The proposed scan driver uses single clock signal to reduce the power consumption. This scan driver is simulated at the operating frequency of 153.6 kHz, which is the driving condition of 10.0-inch wide quadruple extended graphics array (WQXGA, 1600 × 2560) display with the frame frequency of 60 Hz. The power consumption of ten stages of the proposed circuit is 0.39 mW. The proposed scan driver reduces the power consumption by 69% compared to the conventional scan driver.en_US
dc.language.isoenen_US
dc.publisherSOCIETY FOR INFORMATION DISPLAYen_US
dc.subjectamorphous indium-gallium-zinc-oxide thin-film transistoren_US
dc.subjecta-IGZO TFTen_US
dc.subjectintegrated scan driveren_US
dc.subjecthigh-resolution displaysen_US
dc.titleA Low-Power Scan Driver Using Depletion-Mode a-IGZO TFTs for High-Resolution Displaysen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/j.2168-0159.2014.tb00262.x-
dc.relation.page1009-1012-
dc.contributor.googleauthorAhn, S. J.-
dc.contributor.googleauthorHong, S. K.-
dc.contributor.googleauthorKwon, O. K.-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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