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dc.contributor.author김영호-
dc.date.accessioned2018-03-09T06:58:54Z-
dc.date.available2018-03-09T06:58:54Z-
dc.date.issued2013-05-
dc.identifier.citationIEEE 63rd, 2013, P.755-760en_US
dc.identifier.issn0569-5503-
dc.identifier.urihttp://ieeexplore.ieee.org/document/6575657/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/44344-
dc.description.abstractWe successfully fabricated an eco-friendly Cu-Zn wetting layer for Sn-Ag-Cu (SAC) solders by electroplating in a cyanide-free solution. The reliabilities of solder joints formed on the Cu-Zn solder wetting layer were evaluated through the drop impact test and thermal cycling (T/C) test. First, board-level drop impact test was performed with the SAC solder joints formed on electroplated Cu or Cu-Zn layers. Drop test samples were fabricated by connecting SAC solders with Cu or Cu-20 wt% Zn wetting layer formed on printed circuit boards (PCBs). Cu-20 wt% Zn layers were electroplated in cyanide and cyanide-free solutions. Drop impact resistance of Cu-Zn/SAC/Cu-Zn solder joints was superior to that of Cu/SAC/Cu solder joints. Next, for T/C test, Cu pillar bumps with Sn-2.5 wt% Ag capping layers were fabricated on Si chip and joined with Cu or Cu-Zn layer on PCB substrate by flip chip bonding. T/C test was carried out between -55°C and 125°C up to 3000 cycles. The flip chip joints formed on either Cu or Cu-Zn layer showed excellent T/C reliability in the underfilled condition. The failure was not observed in both samples after 3000 cycles. When underfill was not applied in the flip chip joints, Cu-Zn samples exhibited better results than Cu samples even though both samples had short thermal fatigue life. The improvement of reliability in Cu-Zn samples was ascribed to the beneficial effect of Zn. Our results implied that electroplating of Cu-Zn layers in a cyanide-free solution was successful and the reliability of solder joints can be enhanced by applying a Cu-Zn solder wetting layer.en_US
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.subjectComponents, Circuits, Devices and Systemsen_US
dc.subjectEngineered Materials, Dielectrics and Plasmasen_US
dc.subjectFields, Waves and Electromagneticsen_US
dc.subjectSolderingen_US
dc.subjectReliabilityen_US
dc.subjectZincen_US
dc.subjectSubstratesen_US
dc.subjectFatigueen_US
dc.subjectSiliconen_US
dc.subjectResistanceen_US
dc.titleAn Eco-friendly Cu-Zn Wetting Layer for Highly Reliable Solder Jointsen_US
dc.typeArticleen_US
dc.relation.volume63-
dc.identifier.doi10.1109/ECTC.2013.6575657-
dc.relation.page755-760-
dc.contributor.googleauthorKim, Young Min-
dc.contributor.googleauthorKim, Sun-Chul-
dc.contributor.googleauthorKim, Young-Ho-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidkimyh-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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