Acceleration of applied voltage on metallic ion migration of wires in NTC thermistor temperature sensors

Title
Acceleration of applied voltage on metallic ion migration of wires in NTC thermistor temperature sensors
Author
김주형
Keywords
Ion migration; Water drop test; Thermistor; Acceleration life test; Inverse power model; FAILURE; TESTS
Issue Date
2013-03
Publisher
Elsevier Science B.V., Amsterdam,
Citation
Engineering failure analysis, Vol.28, pp.252-263
Abstract
The research on NTC (Negative Temperature Coefficient) thermistors often used in temperature sensors has usually focused on performance, and almost no research have been previously done with the focus on reliability, even though field failures of NTC thermistors caused by ion migration are increasing. Therefore, this paper focuses on ion migration between wires, which has a close relationship with field failures of NTC thermistors by measuring the time when ion migration occurs according to different distances between wires and the applied voltage, and quantitatively analyzing the mechanism of ion migration occurrence, acceleration and correlation with ion migration due to applied voltage. Ion migrations between Cu wires occur because of the absorption and condensation of water. Also, due to the inherently brittle characteristics of the dendrite, repeated separation and coalescence were observed. The results of estimating the time of ion migration according to the applied voltage using both Weibull distribution and the same shape parameter showed a good match with the inverse power model, and an index and a specific parameter expressing the sensitivity of ion migration occurrence could be extracted by analysis. (C) 2012 Elsevier Ltd. All rights reserved.
URI
https://www.sciencedirect.com/science/article/abs/pii/S1350630712002373http://hdl.handle.net/20.500.11754/44125
ISSN
1350-6307
DOI
10.1016/j.engfailanal.2012.10.019
Appears in Collections:
CENTER FOR CREATIVE CONVERGENCE EDUCATION[S](창의융합교육원) > ETC
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE