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dc.contributor.author박진성-
dc.date.accessioned2018-02-14T02:21:15Z-
dc.date.available2018-02-14T02:21:15Z-
dc.date.issued2011-08-
dc.identifier.citationSynthetic metals, Vol.161 No.17-18 [2011], 1953-1957en_US
dc.identifier.issn0379-6779-
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S0379677911002931?via%3Dihub-
dc.description.abstractA bottom contact organic thin film transistor (OTFT) is fabricated with an organic double-layered gate insulator (GI) and pentacene. Poly(methyl methacrylate) (PMMA) and 2-mercapto 5-nitrobenzimidazole (MNB) layers are deposited on the gate insulator and source/drain gold (S/D, Au) electrode before depositing pentacene to investigate the device properties. The sequence of surface treatment significantly affects the device performance. The ultra-thin PMMA (less than 5nm) was deposited on the organic gate insulator and S/D metal by the spin coating method, which caused no deterioration of the on-state current (Ion), although a bottom contact structure was exploited. The lack of increase in the contact resistance (Rc) may be due to the difference in wettability between PMMA/Au and PMMA/organic GI. As a result, the devices treated with PMMA→MNB showed much better Ion behavior than those fabricated with MNB→PMMA. We report on the difference in the physical and electrical performances associated with the surface treatment sequence.en_US
dc.description.sponsorshipProf. J. S. Park acknowledges funding from the collaborative R&D program with technology advanced country "Development of materials and stacked device structure for next generation solar cells, 2010-advanced-B-105" by the Ministry of Knowledge and Economy. Prof. M. C. Suh gratefully acknowledges to Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education. Science and Technology (Grant No. NRF-2011-0006847).en_US
dc.language.isoenen_US
dc.publisherElsevier Science B.V., Amsterdam.en_US
dc.subjectOrganic thin film transistor (OTFT)en_US
dc.subjectPMMAen_US
dc.subjectMNBen_US
dc.subjectContact resistanceen_US
dc.subjectSequence of surface treatmenten_US
dc.subjectWettabilityen_US
dc.titleThe effect of surface treatment of bottom contact organic thin film transistoren_US
dc.typeArticleen_US
dc.relation.no17-18-
dc.relation.volume161-
dc.identifier.doi10.1016/j.synthmet.2011.07.001-
dc.relation.page1953-1957-
dc.relation.journalSYNTHETIC METALS-
dc.contributor.googleauthorJeon, Woo Sik-
dc.contributor.googleauthorPark, Jung Soo-
dc.contributor.googleauthorKwon, Jang Hyuk-
dc.contributor.googleauthorSuh, Min Chul-
dc.contributor.googleauthorPark, Jin-Seong-
dc.relation.code2011209031-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidjsparklime-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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