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dc.contributor.author권오경-
dc.date.accessioned2018-02-12T04:26:52Z-
dc.date.available2018-02-12T04:26:52Z-
dc.date.issued2011-07-
dc.identifier.citationJapanese Journal of Applied Physics, 2012, 51(3), 03CD01en_US
dc.identifier.issn0021-4922-
dc.identifier.issn1347-4065-
dc.identifier.urihttp://iopscience.iop.org/article/10.1143/JJAP.51.03CD01/meta-
dc.description.abstractA threshold-voltage-shift compensation and suppression method for active matrix organic light-emitting diode (AMOLED) displays fabricated using a hydrogenated amorphous silicon thin-film transistor (TFT) backplane is proposed. The proposed method compensates for the threshold voltage variation of TFTs due to different threshold voltage shifts during emission time and extends the lifetime of the AMOLED panel. Measurement results show that the error range of emission current is from -1.1 to +1.7% when the threshold voltage of TFTs varies from 1.2 to 3.0 V. (C) 2012 The Japan Society of Applied Physicsen_US
dc.language.isoenen_US
dc.publisherIOP Publishing LTDen_US
dc.titleThreshold-Voltage-Shift Compensation and Suppression Method for Active Matrix Organic Light Emitting Diode Displaysen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.51.03CD01-
dc.relation.page17-20-
dc.contributor.googleauthor권, 오경-
dc.contributor.googleauthorKwon, Oh-Kyong-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF ELECTRONIC ENGINEERING-
dc.identifier.pidokwon-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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