| 2009-01 | Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-11 | Hybrid Test Data Compression Technique for Low-power Scan Test Data | 박성주 |
| 2005-09 | Hybrid Test Data Compression Technique for SoC Scan Testing | 박성주 |
| 2015-02 | Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs | 박성주 |
| 2006-10 | IEEE 1149.1 테스트 기능이 내장된 PCI/USB 통합 인터페이스 회로의 설계 | 박성주 |
| 2006-10 | IEEE 1149.1 테스트 기능이 내장된PCI/USB 통합 인터페이스 회로의 설계 | 박성주 |
| 2013-09 | IEEE 1149.7 표준 테스트 인터페이스를 사용한 핀 수 절감 테스트 기술 | 박성주 |
| 2008-02 | IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트 | 박성주 |
| 2004-11 | InfiniBand/PCI-Express 4X Framer/Deframer 모듈 FPGA설계 | 박성주 |
| 2006-10 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains | 박성주 |
| 2008-06 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains | 박성주 |
| 2008-05 | Low Cost Scan Test for IEEE 1500-Based SoC | 박성주 |
| 2016-10 | Low Power Scan Chain Reordering Method with Limited Routing Congestion for Code-based Test Data Compression | 박성주 |
| 2008-05 | Low-cost scan test for IEEE-1500-Based SoC | 박성주 |
| 2002-04 | Microcode-based memory BIST implementing modified march algorithms | 박성주 |
| 2011-04 | Multiple cell upsets tolerant content-addressable memory | 박성주 |
| 2004-07 | A New Design of High Speed Parallel CRC Generator | 박성주 |
| 2004-10 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2003-02 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2004-06 | A New State Assignment Technique for Testing and Low Power | 박성주 |
| 2004-02 | A new synthesis technique of sequential circuits for low power and testing | 박성주 |
| 2017-07 | On Diagnosing the Aging Level of Automotive Semiconductor Devices | 박성주 |
| 2010-07 | On-Chip Support for NoC-Based SoC Debugging | 박성주 |
| 2008-06 | Optimal SoC Test Interface for Wafer and Final Tests | 박성주 |
| 2006-10 | Parallel CRC Logic Optimization Algorithm for High Speed Communication Systems | 박성주 |
| 2009-11 | Parallel test method for NoC-based SoCs | 박성주 |
| 2011-04 | Performance Improvement by Logic Sharing on Using Unused Spare Columns for Memory EC | 박성주 |
| 2004-10 | A Reconfigurable Test Access Mechanism for Embedded Core Test | 박성주 |
| 2011-08 | Redundancy TSV 연결 테스트를 위한 래퍼셀 설계 | 박성주 |
| 2014-01 | Reliability issues for automobile SoCs | 박성주 |
