| 2007-05 | Design of Test Access Mechanism for AMBA Based System-on-a-Chip | 박성주 |
| 2007-05 | Design of test access mechanism for AMBA-based system-on-a-chip | 박성주 |
| 2007-10 | Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC | 박성주 |
| 2008-11 | A Design-for-Debug(DfD) for NoC-Based SoC Debugging via NoC | 박성주 |
| 2015-05 | Efficient diagnosis technique for aging defects on automotive semiconductor chips | 박성주 |
| 2005-05 | Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults | 박성주 |
| 2006-11 | Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2008-06 | An Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-12 | An Efficient Link Controller for Test Access to IP Core-based Embedded System Chips | 박성주 |
| 2020-08 | Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering | 박성주 |
| 2014-06 | Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC | 박성주 |
| 2016-04 | Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells | 박성주 |
| 2008-10 | An Efficient Secure Scan Design for an SoC Embedding AES Core | 박성주 |
| 2012-09 | Efficient Use of Unused Spare Columns for Reducing Memory Miscorrections | 박성주 |
| 2011-11 | Efficient use of unused spare columns to improve memory error correcting rate | 박성주 |
| 2017-11 | Enabling test/diagnosis of automotive semiconductor chips through FlexRay network | 박성주 |
| 2016-01 | FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법 | 박성주 |
| 2013-11 | FlexRay를 이용한 자동차 신뢰성 향상 기법 | 박성주 |
| 2014-05 | Frequency-ordered 기반 FDR 테스트패턴 압축 알고리즘 | 박성주 |
| 2009-01 | Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-11 | Hybrid Test Data Compression Technique for Low-power Scan Test Data | 박성주 |
| 2005-09 | Hybrid Test Data Compression Technique for SoC Scan Testing | 박성주 |
| 2015-02 | Hybrid Test Data Transportation Scheme for Advanced NoC-Based SoCs | 박성주 |
| 2006-10 | IEEE 1149.1 테스트 기능이 내장된 PCI/USB 통합 인터페이스 회로의 설계 | 박성주 |
| 2006-10 | IEEE 1149.1 테스트 기능이 내장된PCI/USB 통합 인터페이스 회로의 설계 | 박성주 |
| 2013-09 | IEEE 1149.7 표준 테스트 인터페이스를 사용한 핀 수 절감 테스트 기술 | 박성주 |
| 2008-02 | IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트 | 박성주 |
| 2004-11 | InfiniBand/PCI-Express 4X Framer/Deframer 모듈 FPGA설계 | 박성주 |
| 2006-10 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains | 박성주 |
| 2008-06 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains | 박성주 |
