| 2013-11 | CAN 프로토콜을 이용한 칩 고장 진단 기술 개발 | 박성주 |
| 2020-01 | CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience | 박성주 |
| 2012-12 | Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress | 박성주 |
| 2006-11 | A Compression Improvement Technique for Low-Power Scan Test Data | 박성주 |
| 2018-04 | Cost-efficient Chip Identification Method using Scan Flip-flop based Physically Unclonable Function | 박성주 |
| 2007-12 | Crosstalk 고장 점검을 위한 효과적인 연결선 테스트 패턴 생성 알고리즘에 관한 연구 | 박성주 |
| 2005-07 | Crosstalk과 정적 고장을 고려한 효과적인 연결선 테스트 알고리즘 및 BIST 구현 | 박성주 |
| 2005-07 | Crosstalk과 정적 고장을 고려한 효과적인 연결선 테스트 알고리즘 및 BIST 구현 | 박성주 |
| 2007-05 | Design of Test Access Mechanism for AMBA Based System-on-a-Chip | 박성주 |
| 2007-05 | Design of test access mechanism for AMBA-based system-on-a-chip | 박성주 |
| 2007-10 | Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC | 박성주 |
| 2008-11 | A Design-for-Debug(DfD) for NoC-Based SoC Debugging via NoC | 박성주 |
| 2015-05 | Efficient diagnosis technique for aging defects on automotive semiconductor chips | 박성주 |
| 2005-05 | Efficient Interconnect Test Patterns and BIST Implementation for Crosstalk and Static Faults | 박성주 |
| 2006-11 | Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2008-06 | An Efficient Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-12 | An Efficient Link Controller for Test Access to IP Core-based Embedded System Chips | 박성주 |
| 2020-08 | Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering | 박성주 |
| 2014-06 | Efficient Parallel Scan Test Technique for Cores on AMBA-based SoC | 박성주 |
| 2016-04 | Efficient Pre-Bond Testing of TSV Defects Based on IEEE std. 1500 Wrapper Cells | 박성주 |
| 2008-10 | An Efficient Secure Scan Design for an SoC Embedding AES Core | 박성주 |
| 2012-09 | Efficient Use of Unused Spare Columns for Reducing Memory Miscorrections | 박성주 |
| 2011-11 | Efficient use of unused spare columns to improve memory error correcting rate | 박성주 |
| 2017-11 | Enabling test/diagnosis of automotive semiconductor chips through FlexRay network | 박성주 |
| 2016-01 | FlexRay 프로토콜을 이용한 차량용 SoC 고장 진단 기법 | 박성주 |
| 2013-11 | FlexRay를 이용한 자동차 신뢰성 향상 기법 | 박성주 |
| 2014-05 | Frequency-ordered 기반 FDR 테스트패턴 압축 알고리즘 | 박성주 |
| 2009-01 | Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults | 박성주 |
| 2007-11 | Hybrid Test Data Compression Technique for Low-power Scan Test Data | 박성주 |
| 2005-09 | Hybrid Test Data Compression Technique for SoC Scan Testing | 박성주 |
