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Mapping the process dependent conductivity of carbon nanotube thin-films using a non-invasive contact probing system

Title
Mapping the process dependent conductivity of carbon nanotube thin-films using a non-invasive contact probing system
Author
이승백
Keywords
TRANSPARENT; ELECTRODES; FABRICATION; PERCOLATION; SURFACTANT; MICROSCOPY; NETWORKS
Issue Date
2016-02
Publisher
AMER INST PHYSICS
Citation
REVIEW OF SCIENTIFIC INSTRUMENTS, v. 87, NO 2, Article number 023903, Page. 239031-239037
Abstract
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local surface conductivity of macroscopic thin-films of carbon nanotubes. Using the NICP system, we were able to obtain the local sheet resistance of the conducting thin-films continuously at similar to 10 mu m resolution over few centimeters which would not have been possible using conventional contact probing methods. Measurements performed on carbon nanotube thin-films with various nanotube densities, physical, and chemical treatments revealed that the local variation in electrical characteristics was not reflected in global conductance measurements. This demonstrated the usefulness of the NICP system for evaluating the effect of processing on the electrical uniformity of conducting thin-films made using nanomaterials. (C) 2016 AIP Publishing LLC.
URI
http://aip.scitation.org/doi/10.1063/1.4941294http://hdl.handle.net/20.500.11754/33885
ISSN
0034-6748; 1089-7623
DOI
10.1063/1.4941294
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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