Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권오경 | - |
dc.date.accessioned | 2017-08-23T08:07:22Z | - |
dc.date.available | 2017-08-23T08:07:22Z | - |
dc.date.issued | 2015-11 | - |
dc.identifier.citation | SENSORS, v. 16, NO 1, Page. 1-2 | en_US |
dc.identifier.issn | 1424-8220 | - |
dc.identifier.uri | http://www.mdpi.com/1424-8220/16/1/27 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/28754 | - |
dc.description.abstract | This paper presents a fast multiple sampling method for low-noise CMOS image sensor (CIS) applications with column-parallel successive approximation register analog-to-digital converters (SAR ADCs). The 12-bit SAR ADC using the proposed multiple sampling method decreases the A/D conversion time by repeatedly converting a pixel output to 4-bit after the first 12-bit A/D conversion, reducing noise of the CIS by one over the square root of the number of samplings. The area of the 12-bit SAR ADC is reduced by using a 10-bit capacitor digital-to-analog converter (DAC) with four scaled reference voltages. In addition, a simple up/down counter-based digital processing logic is proposed to perform complex calculations for multiple sampling and digital correlated double sampling. To verify the proposed multiple sampling method, a 256 x 128 pixel array CIS with 12-bit SAR ADCs was fabricated using 0.18 m CMOS process. The measurement results shows that the proposed multiple sampling method reduces each A/D conversion time from 1.2 s to 0.45 s and random noise from 848.3 V to 270.4 V, achieving a dynamic range of 68.1 dB and an SNR of 39.2 dB. | en_US |
dc.description.sponsorship | This research was supported by the Industrial and Educational Cooperative R&D Program between Hanyang University and SK Hynix Semiconductor Inc. The authors would like to thank Jaseung Gou and Sang-Dong Yoo of SK Hynix Semi-conductor Inc. for their useful discussion and feedback. | en_US |
dc.language.iso | en | en_US |
dc.publisher | MDPI AG | en_US |
dc.subject | successive approximation register ADC | en_US |
dc.subject | column parallel readout | en_US |
dc.subject | CMOS image sensor | en_US |
dc.title | A Fast Multiple Sampling Method for Low-Noise CMOS Image Sensors With Column-Parallel 12-bit SAR ADCs | en_US |
dc.type | Article | en_US |
dc.relation.no | 1 | - |
dc.relation.volume | 16 | - |
dc.identifier.doi | 10.3390/s16010027 | - |
dc.relation.page | 1-2 | - |
dc.relation.journal | SENSORS | - |
dc.contributor.googleauthor | Kim, Min-Kyu | - |
dc.contributor.googleauthor | Hong, Seong-Kwan | - |
dc.contributor.googleauthor | Kwon, Oh-Kyong | - |
dc.relation.code | 2015009172 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF ELECTRONIC ENGINEERING | - |
dc.identifier.pid | okwon | - |
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