Thickness and temperature dependences of the degradation and the breakdown for MgO-based magnetic tunnel junctions

Title
Thickness and temperature dependences of the degradation and the breakdown for MgO-based magnetic tunnel junctions
Authors
송윤흡
Keywords
Magnetic tunnel junction; MgO; Degradation; Breakdown
Issue Date
2015-04
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 66, NO 6, Page. 972-977
Abstract
The reliability of a magnetic tunnel junction (MTJ) with an MgO tunnel barrier was evaluated. In particular, various voltage tests were used to investigate the effects of the barrier thickness and the temperature on the resistance drift. We compared the resistance change during a constant voltage stress (CVS) test and confirmed a trap/detrap phenomenon during the interval stress for different barrier thicknesses and temperatures. The resistance drift representing degradation and the time to breakdown (T (BD) ) representing the breakdown characteristic were better for a thicker barrier and lower temperature, but were worse for a thinner barrier and a higher temperature. The results suggest that breakdown and degradation due to trap generation strongly depend on both the barrier thickness and the temperature. Furthermore, as the TBD varies at steady rates with changing barrier thickness, temperature, and electric field, we assume that a MTJ with an adnormal thin layer of MgO can be screened effectively based on the predicted T (BD) . As a result, the barrier thickness and the temperature are very important in determining the reliability of a MTJ, and this study is expected to be helpful in understanding the degradation and the breakdown of a MTJ.
URI
http://link.springer.com/article/10.3938%2Fjkps.66.972http://hdl.handle.net/20.500.11754/23821
ISSN
0374-4884; 1976-8524
DOI
http://dx.doi.org/10.3938/jkps.66.972
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > DEPARTMENT OF ELECTRONIC ENGINEERING(융합전자공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE