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dc.contributor.author최창환-
dc.date.accessioned2016-05-31T07:58:03Z-
dc.date.available2016-05-31T07:58:03Z-
dc.date.issued2015-01-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v. 106, NO 2, Page. 21601-21604en_US
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/21462-
dc.identifier.urihttp://aip.scitation.org/doi/10.1063/1.4905634-
dc.description.abstractWe deposited a metal oxide buffer layer before atomic layer deposition (ALD) of Al2O3 onto exfoliated molybdenum disulfide (MoS2) in order to accomplish enhanced integration. We demonstrate that even at a high temperature, functionalization of MoS2 by means of a metal oxide buffer layer can effectively provide nucleation sites for ALD precursors, enabling much better surface coverage of Al2O3. It is shown that using a metal oxide buffer layer not only allows high temperature ALD process, resulting in highly improved quality of Al2O3/MoS2 interface, but also leaves MoS2 intact. (C) 2015 AIP Publishing LLC.en_US
dc.language.isoenen_US
dc.publisherAMER INST PHYSICSen_US
dc.subjectDEPOSITIONen_US
dc.subjectDICHALCOGENIDE NANOSHEETSen_US
dc.subjectHIGH-K DIELECTRICSen_US
dc.subject2-DIMENSIONAL CRYSTALSen_US
dc.subjectHIGH-PERFORMANCEen_US
dc.subjectMULTILAYER MOS2en_US
dc.subjectSURFACE-ENERGYen_US
dc.subjectMONOLAYER MOS2en_US
dc.subjectTRANSISTORSen_US
dc.subjectGRAPHENEen_US
dc.titleImproved high temperature integration of Al2O3 on MoS2 by using a metal oxide buffer layeren_US
dc.typeArticleen_US
dc.relation.no2-
dc.relation.volume106-
dc.identifier.doi10.1063/1.4905634-
dc.relation.page21601-21604-
dc.relation.journalAPPLIED PHYSICS LETTERS-
dc.contributor.googleauthorSon, Seokki-
dc.contributor.googleauthorYu, Sunmoon-
dc.contributor.googleauthorKim, Dohyung-
dc.contributor.googleauthorChoi, Moonseok-
dc.contributor.googleauthorChoi, Changhwan-
dc.relation.code2015002886-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE & ENGINEERING-
dc.identifier.pidcchoi-


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