Time Multiplexed LBIST for in-field testing of Automotives AI Accelerators
- Title
- Time Multiplexed LBIST for in-field testing of Automotives AI Accelerators
- Author
- 박성주
- Keywords
- Artificial Intelligence (AI) accelerators; Automotives; built-in self-test (BIST); test; time multiplexed
- Issue Date
- 2021-11
- Publisher
- IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
- Citation
- IEICE ELECTRONICS EXPRESS; NOV 15 2021, 5p.
- Abstract
- Logic BIST is a safety mechanism, which performs testing for
Automotive electronics. However, pseudorandom LBIST patterns results
in increased test time and test power. In this letter, a novel time multiplexed
LBIST is presented to overcome test related problems of AI accelerators.
First, the accelerator array is divided into smaller sub arrays, which are
tested on time multiplexed clock cycles. This: 1) improves overall test
time, under the given test power limit, 2) allows reduction in shift power,
under given test time limits and 3) since only one sub array is clocked at a
time, the peak power is reduced.
- URI
- https://www.jstage.jst.go.jp/article/elex/18/24/18_18.20210451/_articlehttps://repository.hanyang.ac.kr/handle/20.500.11754/169836
- ISSN
- 13492543
- DOI
- 10.1587/elex.18.20210451
- Appears in Collections:
- ETC[S] > 연구정보
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