23 3

Full metadata record

DC FieldValueLanguage
dc.contributor.author임동진-
dc.date.accessioned2019-12-06T01:33:28Z-
dc.date.available2019-12-06T01:33:28Z-
dc.date.issued2019-08-
dc.identifier.citationAPPLIED SCIENCES-BASEL, v. 9, No. 17, Article no. 3492en_US
dc.identifier.issn2076-3417-
dc.identifier.urihttps://www.mdpi.com/2076-3417/9/17/3492-
dc.identifier.urihttp://repository.hanyang.ac.kr/handle/20.500.11754/117788-
dc.description.abstractFault localization techniques reduce the effort required when debugging software, as revealed by previous test cases. However, many test cases are required to reduce the number of candidate fault locations. To overcome this disadvantage, various methods were proposed to reduce fault-localization costs by prioritizing test cases. However, because a sufficient number of test cases is required for prioritization, the test-case generation cost remains high. This paper proposes a test-case generation method using a state chart to reduce the number of test suites required for fault localization, minimizing the test-case generation and execution times. The test-suite generation process features two phases: fault-detection test-case generation and fault localization in the test cases. Each phase uses mutation analysis to evaluate test cases; the results are employed to improve the test cases according to the objectives of each phase, using genetic algorithms. We provide useful guidelines for application of a search-based mutational method to a state chart; we show that the proposed method improves fault-localization performance in the test-suite generation phase.en_US
dc.description.sponsorshipThis research was funded by the WC300 Technological Innovation R&D Program of Small and Medium Business Administrations (SMBA, Korea) (S2341060, Development of next-generation integrated smart key system based on SoC using IT fusion technology).en_US
dc.language.isoen_USen_US
dc.publisherMDPIen_US
dc.subjectmodel-based testingen_US
dc.subjectautomatic test-case generationen_US
dc.subjectmutation-based testingen_US
dc.subjectfault localizationen_US
dc.subjectsearch-based algorithmen_US
dc.titleModel-Based Test Suite Generation Using Mutation Analysis for Fault Localizationen_US
dc.typeArticleen_US
dc.relation.no17-
dc.relation.volume9-
dc.identifier.doi10.3390/app9173492-
dc.relation.page1-24-
dc.relation.journalAPPLIED SCIENCES-BASEL-
dc.contributor.googleauthorChoi, Yoo-Min-
dc.contributor.googleauthorLim, Dong-Jin-
dc.relation.code2019038379-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidlimdj-


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE