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Bayesian analysis of two-phase degradation data based on change-point Wiener process

Title
Bayesian analysis of two-phase degradation data based on change-point Wiener process
Author
배석주
Keywords
Change-point; Degradation test; Hierarchical Bayesian; Wiener process
Issue Date
2018-03
Publisher
ELSEVIER SCI LTD
Citation
RELIABILITY ENGINEERING & SYSTEM SAFETY, v. 170, page. 244-256
Abstract
In degradation test of some products such as plasma display panels (PDPs) and organic light emitting diodes (OLEDs), observed degradation paths tend to exhibit two-phase patterns over testing period. In this paper, we propose a change-point Wiener process (CPWP) model to fit the degradation paths with two-phase pattern mainly in a Bayesian framework. Considering the distinct degradation behaviors between testing units, we assume that degradation rates and change-points vary from unit to unit. Then hierarchical Bayesian approach is employed to estimate the parameters in the CPWP model. For comparison purpose, we also develop the maximum likelihood (ML) method. The results from simulation study show that the hierarchical Bayesian approach provides more robust inference on the model parameters than ML method. The analysis of OLED degradation data presents that the CPWP model outperforms three other existing models in terms of reliability prediction. (C) 2017 Elsevier Ltd. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S095183201730265X?via%3Dihubhttp://repository.hanyang.ac.kr/handle/20.500.11754/117761
ISSN
0951-8320; 1879-0836
DOI
10.1016/j.ress.2017.09.027
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > INDUSTRIAL ENGINEERING(산업공학과) > Articles
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