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dc.contributor.author박성주-
dc.date.accessioned2019-10-24T06:36:30Z-
dc.date.available2019-10-24T06:36:30Z-
dc.date.issued2005-09-
dc.identifier.citationProceedings 2005 IEEE International SOC Conference, Page. 69-72en_US
dc.identifier.issn2164-1676-
dc.identifier.urihttps://ieeexplore.ieee.org/document/1554457-
dc.identifier.urihttp://repository.hanyang.ac.kr/handle/20.500.11754/111465-
dc.description.abstractA hybrid test data compression technique is proposed to reduce the test application time while keeping test power low by assigning "don't cares" to reduce transitions. Initially, test data set is compressed by 0/1 prefix run-length codes. Then, the compressed data are chopped into fixed-length blocks and further encoded by Huffman algorithm. It is observed that the global compression is highly dependent upon the chopping size of initially compressed data upon run-length codes. Since the actual Huffman codes make use of a very small portion of the complete coding space, the decoding logic of our hybrid scheme can be implemented with a very small area penalty. The experiments show significant data compression compared with state-of-the-art techniquesen_US
dc.description.sponsorshipThis work was supported in part by the Korea Science and Engineering Foundation#RO1–2003-000–10150-0.en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.titleHybrid Test Data Compression Technique for SoC Scan Testingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/SOCC.2005.1554457-
dc.contributor.googleauthorCho, S.-
dc.contributor.googleauthorSong, J.-
dc.contributor.googleauthorYi, H.-
dc.contributor.googleauthorPark, S.-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF COMPUTING[E]-
dc.sector.departmentDIVISION OF COMPUTER SCIENCE-
dc.identifier.pidpaksj-
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COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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