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Hybrid Test Data Compression Technique for SoC Scan Testing

Title
Hybrid Test Data Compression Technique for SoC Scan Testing
Author
박성주
Issue Date
2005-09
Publisher
IEEE
Citation
Proceedings 2005 IEEE International SOC Conference, Page. 69-72
Abstract
A hybrid test data compression technique is proposed to reduce the test application time while keeping test power low by assigning "don't cares" to reduce transitions. Initially, test data set is compressed by 0/1 prefix run-length codes. Then, the compressed data are chopped into fixed-length blocks and further encoded by Huffman algorithm. It is observed that the global compression is highly dependent upon the chopping size of initially compressed data upon run-length codes. Since the actual Huffman codes make use of a very small portion of the complete coding space, the decoding logic of our hybrid scheme can be implemented with a very small area penalty. The experiments show significant data compression compared with state-of-the-art techniques
URI
https://ieeexplore.ieee.org/document/1554457http://repository.hanyang.ac.kr/handle/20.500.11754/111465
ISSN
2164-1676
DOI
10.1109/SOCC.2005.1554457
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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