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A Compression Improvement Technique for Low-Power Scan Test Data

Title
A Compression Improvement Technique for Low-Power Scan Test Data
Author
박성주
Issue Date
2006-11
Publisher
IEEE
Citation
TENCON 2006 - 2006 IEEE Region 10 Conference, Article no. 4142590
Abstract
The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bitwise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time
URI
https://ieeexplore.ieee.org/document/4142590http://repository.hanyang.ac.kr/handle/20.500.11754/108803
ISBN
978-142440549-7
ISSN
2159-3442; 2159-3450
DOI
10.1109/TENCON.2006.344040
Appears in Collections:
COLLEGE OF COMPUTING[E] > COMPUTER SCIENCE(소프트웨어학부) > Articles
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