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Morphology and ellipsometry study of pentacene films grown on native SiO2 and glass substrates

Title
Morphology and ellipsometry study of pentacene films grown on native SiO2 and glass substrates
Author
안일신
Keywords
organic thin film; pentacene; ellipsometry; X-ray diffraction; exciton
Issue Date
2006-09
Publisher
Elsevier
Citation
Current Applied Physics, v. 6, No. 5, Page. 925-930
Abstract
We have studied the morphology and optical properties of pentacene films in the thickness range of 300-600 nm using atomic force microscopy and spectroscopic ellipsometry. The films were grown on native SiO2 and glass substrates at room temperature and 80 degrees C. Surface images showed that the films were formed by the grain growth. The grains were bigger when the films were grown at 80 degrees C. but this was accompanied with the diminished crystalline ordering. Even though the thickness was the same, the ellipsometry spectra were different for the samples grown under different condition. When the room temperature sample was annealed at 150 degrees C for 1 h the ellipsometry spectrum did not change indicating that the pentacene film is thermally stable. (c) 2005 Elsevier B.V. All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S1567173905001306http://repository.hanyang.ac.kr/handle/20.500.11754/108313
ISSN
1567-1739
DOI
10.1016/j.cap.2005.01.041
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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